Patent Assignment
Reel/Frame 011784/0554
Assignment of Assignor's Interest
Recorded: 2001-05-07
Received: 2001-05-14
Pages: 3
Assignor
OSAWA, TOKUYA
Executed: 2001-04-24
Assignee
MITSUBISHI DENKI KABUSHIKI KAISHA
2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO, JPX, 100-8, JAPAN
Covered Property
(1)
Apparatus for Testing Semiconductor Integrated Circuits
Application:
09/849,255 →