IP Library › Granted Patent US 6,742,149
Granted Patent Utility
US 6,742,149 · Confirmation No. 8558

APPARATUS FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUITS

Inventor: Tokuya Osawa
Patented Case View Patent ↗ View Publication ↗
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 Code Description Pages PDF
2004-04-13 IFEE Issue Fee Payment (PTO-85B) 1 View
2001-05-07 TRNA Transmittal of New Application 2 View
2001-05-07 ADS Application Data Sheet 1 View
2001-05-07 A.PE Preliminary Amendment 11 View
2001-05-07 SPEC Specification 26 View
2001-05-07 CLM Claims 2 View
2001-05-07 ABST Abstract 1 View
2001-05-07 DRW Drawings-only black and white line drawings 9 View
2001-05-07 OATH Oath or Declaration filed 3 View
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Quick Facts
Patent No.
US 6,742,149
App. No.
09/849,255
Filed
2001-05-07
Granted
2004-05-25
Pub. No.
US20020026612A1
Art Unit
2133
PTA
0 days