IP Library Assignment 011876/0130
Patent Assignment
Reel/Frame 011876/0130

Assignment of Assignor's Interest

Recorded: 2001-06-01 Received: 2001-06-13 Pages: 3
Assignors
CHEN, CHUN-YEN
Executed: 2001-05-28
CHEN, HUNG-CHIEH
Executed: 2001-05-28
Assignee
SILICON INTEGRATED SYSTEMS CORP.
SCIENCE-BASED INDUSTRIAL PARK, NO. 16, CREATION ROAD 1, HSINCHU, TWX, TAIWAN
Covered Property (1)
Method for Measuring Width of Bottom Under Cut During Etching Process
Application: 09/873,157 →