Assignment of Assignor's Interest

Recorded: 2001-06-25 Pages: 5

Assignors

LAGOWSKI, JACEK

Executed: 2001-05-29

SAVTCHOUK, ALEXANDER

Executed: 2001-05-29

WILSON, MARSHALL D.

Executed: 2001-05-29

Assignee

SEMICONDUCTOR DIAGNOSTICS, INC.

SUITE 130, 3650 SPECTRUM BOULEVARD, TAMPA, FLORIDA, 33612

Covered Property (1)

Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current

Application: 60/264,571 →