Patent Application
Provisional
Small
App. No. 60/264,571
· Confirmation No. 7401
Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current
Provisional Application Expired
Inventors
Attorneys & Agents of Record
Prosecution
- Examiner
- TEST_NO, TEST_NO
- Docket No.
- 02695-026P01
- Confirmation No.
- 7401
Child
Claims priority from a provisional application
→
App. 09/810,789
· US 6,597,193
Filed 2001-03-16
· Patented Case
Child
Claims priority from a provisional application
→
App. 09/851,291
· US 6,680,621
Filed 2001-05-08
· Patented Case
Child
PCT
Claims priority from a provisional application
→
PCT/US2002/002312
Filed 2002-01-25
· PCT - IPER (International Preliminary Examination Report) 409-416 Mailed
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2001-06-25
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Quick Facts
- App. No.
- 60/264,571
- Filed
- 2001-01-26
- Examiner
- TEST_NO, TEST_NO
External Links