IP Library › Assignment 011963/0505
Patent Assignment
Reel/Frame 011963/0505

Assignment of Assignor's Interest

Recorded: 2001-07-02 Pages: 2
Assignor
YONEZAWA, EIJI
Executed: 2001-06-27
Assignee
NIDEK CO., LTD.
7-9, SAKAE-CHO, GAMAGORI-SHI, AICHI, JAPAN
Covered Property (1)
Defect Inspection Method and Defect Inspection Apparatus
Patent: 6,928,185 →
Application: 09/895,204 →
Publication: US 2002/0001405