Patent Assignment
Reel/Frame 011974/0222
Assignment of Assignor's Interest
Recorded: 2001-07-05
Pages: 5
Assignor
HOUSAKO, TAKAHIRO
Executed: 2001-06-28
Assignee
ADVANTEST CORPORATION
32-1, ASAHICHO 1-CHOME, NERIMA-KU, TOKYO, JAPAN
Covered Property
(1)
Method and Apparatus for Testing Semiconductor Devices
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.