Patent Assignment
Reel/Frame 011975/0127
Assignment of Assignor's Interest
Recorded: 2001-07-02
Received: 2001-07-18
Pages: 2
Assignor
LENSING, KEVIN R.
Executed: 2001-06-25
Assignee
ADVANCED MICRO DEVICES, INC.
5204 E. BEN WHITE BLVD., AUSTIN, TX, 78741, UNITED STATES
Covered Property
(1)
Method of Using Scatterometry Measurements to Control Photoresist Etch Process
Application:
09/897,205 →