Patent Assignment
Reel/Frame 012118/0970
Assignment of Assignor's Interest
Recorded: 2001-08-27
Pages: 2
Assignor
MIYAGI, YUJI
Executed: 2001-08-24
Assignee
NEC CORPORATION
7-1 SHIBA 5-CHOME, MINATO-KU, TOKYO 108-01, JAPAN
Covered Property
(1)
Wafer Inspection Device and Wafer Inspection Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.