Patent Assignment
Reel/Frame 012127/0739
Assignment of Assignor's Interest
Recorded: 2001-09-04
Pages: 7
Assignors
SAVTOCHOUK, ALEXANDER
Executed: 2001-08-14
LAGOWSKI, JACEK
Executed: 2001-08-13
D'AMICO, JOHN
Executed: 2001-08-16
WILSON, MARSHALL D.
Executed: 2001-08-14
JASTRZEBSKI, LUBOMIR L.
Executed: 2001-08-15
Assignee
SEMICONDUCTOR DIAGNOSTICS, INC.
SUITE 130, 3650 SPECTRUM BOULEVARD, TAMPA, FLORIDA, 33612
Covered Property
(1)
Steady State Method for Measuring the Thickness and the Capacitance of Ultra Thin Dielectric in the Presence of Substantial Leakage Current