Patent Assignment
Reel/Frame 012160/0740
Assignment of Assignor's Interest
Recorded: 2001-09-07
Pages: 4
Assignors
JUN, CHUNG-SAM
Executed: 2001-08-21
CHON, SANG-MUN
Executed: 2001-08-28
KIM, HYOUNG-JIN
Executed: 2001-08-28
LEE, DONG-CHUN
Executed: 2001-08-21
CHOI, SANG-BONG
Executed: 2001-08-28
RYU, SUNG-GON
Executed: 2001-08-22
Assignee
SAMSUNG ELECTRONICS, CO., LTD.
416, MAETAN-DONG, PALDAL-GU, SUWON-CITY, KYUNGKI-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Wafer Color Variation Correcting Method, Selective Wafer Defect Detecting Method, and Computer Readable Recording Media for the Same