Patent Assignment
Reel/Frame 012175/0651
Assignment of Assignor's Interest
Recorded: 2001-09-18
Pages: 2
Assignors
KOHNO, RYUJI
Executed: 2001-08-22
MIURA, HIDEO
Executed: 2001-08-23
KANAMARU, MASATOSHI
Executed: 2001-08-23
SHIMIZU, HIROYA
Executed: 2001-08-23
BAN, NAOTO
Executed: 2001-08-22
Assignee
HITACHI, LTD.
6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU, TOKYO, JAPAN
Covered Property
(1)
Semiconductor Device Testing Apparatus and Semiconductor Device Manufacturing Method Using It
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.