IP Library Assignment 012277/0790
Patent Assignment
Reel/Frame 012277/0790

Assignment of Assignor's Interest

Recorded: 2001-10-23 Pages: 2
Assignors
SHIBATA, YUKIHIRO
Executed: 2001-08-29
MAEDA, SHUNJI
Executed: 2001-09-19
KEMBO, YUKIO
Executed: 2001-09-10
Assignee
HITACHI, LTD.
6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU, TOKYO, JAPAN
Covered Property (1)
Method for Inspecting Defects and an Apparatus for the Same
Patent: 6,850,320 →
Application: 09/906,678 →
Publication: US 2002/0027653
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jan 6, 2014
From: HITACHI, LTD.
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 031872/0513 →