IP Library Assignment 012294/0552
Patent Assignment
Reel/Frame 012294/0552

Assignment of Assignor's Interest

Recorded: 2001-10-31 Pages: 3
Assignors
SHIBATA, SATOSHI
Executed: 2001-10-23
NAMBU, YUKO
Executed: 2001-10-23
Assignee
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
1006, OAZA KADOMA, KADOMA-SHI, OSAKA 571-8501, JAPAN
Covered Property (1)
Method for Predicting Temperature and Test Wafer for Use in Temperature Prediction
Patent: 6,616,331 →
Application: 09/984,914 →
Publication: US 2002/0075936
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Mar 18, 2020
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 052184/0943 →
Assignment of Assignor's Interest May 27, 2020
From: PANASONIC CORPORATION
To: PANASONIC SEMICONDUCTOR SOLUTIONS CO., LTD.
Reel/Frame 052755/0917 →