IP Library › Assignment 012296/0352
Patent Assignment
Reel/Frame 012296/0352

Assignment of Assignor's Interest

Recorded: 2001-10-31 Pages: 3
Assignors
SHIBATA, SATOSHI
Executed: 2001-10-25
NAMBU, YUKO
Executed: 2001-10-25
Assignee
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
KADOMA-SHI, 1006, OAZA KADOMA, OSAKA 571-8501, JAPAN
Covered Property (1)
Method for Predicting Temperature, Test Wafer for Use in Temperature Prediction, and Method for Evaluating Lamp Heating System
Patent: 6,666,577 →
Application: 09/984,908 →
Publication: US 2002/0051481
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Mar 18, 2020
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 052184/0943 →
Assignment of Assignor's Interest May 27, 2020
From: PANASONIC CORPORATION
To: PANASONIC SEMICONDUCTOR SOLUTIONS CO., LTD.
Reel/Frame 052755/0917 →