IP Library Granted Patent US 6,666,577
Granted Patent Utility
US 6,666,577 · Confirmation No. 2905

METHOD FOR PREDICTING TEMPERATURE, TEST WAFER FOR USE IN TEMPERATURE PREDICTION, AND METHOD FOR EVALUATING LAMP HEATING SYSTEM

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Code Description Pages PDF
2003-10-27 IFEE Issue Fee Payment (PTO-85B) 2 View
2003-10-27 LET. Miscellaneous Incoming Letter 2 View
2003-10-27 DRW Drawings-only black and white line drawings 1 View
2001-10-31 TRNA Transmittal of New Application 2 View
2001-10-31 ADS Application Data Sheet 2 View
2001-10-31 SPEC Specification 25 View
2001-10-31 CLM Claims 5 View
2001-10-31 ABST Abstract 1 View
2001-10-31 DRW Drawings-only black and white line drawings 13 View
2001-10-31 OATH Oath or Declaration filed 3 View
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Quick Facts
Patent No.
US 6,666,577
App. No.
09/984,908
Filed
2001-10-31
Granted
2003-12-23
Pub. No.
US20020051481A1
Art Unit
2859
PTA
0 days