IP Library Patent Application 10638062
Patent Application Utility
App. No. 10/638,062 · Confirmation No. 3478

Method for predicting temperature, test wafer for use in temperature prediction, and method for evaluating lamp heating system

Expressly Abandoned -- During Examination View Publication ↗
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Code Description Pages PDF
2004-04-08 ABN Abandonment 2 View
2004-03-25 EABN Letter Express Abandonment of the application 3 View
2004-01-23 CTNF Non-Final Rejection 10 View
2004-01-23 1449 List of References cited by applicant and considered by examiner 2 View
2004-01-23 892 List of references cited by examiner 3 View
2004-01-23 FOR Foreign Reference 7 View
2004-01-23 FOR Foreign Reference 25 View
2004-01-23 FOR Foreign Reference 13 View
2004-01-23 FOR Foreign Reference 8 View
2004-01-23 FOR Foreign Reference 3 View
2004-01-23 FOR Foreign Reference 6 View
2004-01-23 SRFW Search information including classification, databases and other search related notes 1 View
2004-01-23 SRNT Examiner's search strategy and results 3 View
2004-01-15 SRNT Examiner's search strategy and results 4 View
2003-08-11 TRNA Transmittal of New Application 3 View
2003-08-11 SPEC Specification 25 View
2003-08-11 CLM Claims 5 View
2003-08-11 ABST Abstract 1 View
2003-08-11 DRW Drawings-only black and white line drawings 13 View
2003-08-11 OATH Oath or Declaration filed 3 View
2003-08-11 ADS Application Data Sheet 2 View
2003-08-11 A.PE Preliminary Amendment 1 View
2003-08-11 CLM Claims 2 View
2003-08-11 REM Applicant Arguments/Remarks Made in an Amendment 1 View
2003-08-11 IDS Information Disclosure Statement (IDS) Form (SB08) 4 View
2003-08-11 WFEE Fee Worksheet (SB06) 1 View
2003-08-11 WFEE Fee Worksheet (SB06) 1 View
2003-08-11 WCLM Claims Worksheet (PTO-2022) 1 View
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Quick Facts
App. No.
10/638,062
Filed
2003-08-11
Pub. No.
US20040047394A1
Art Unit
2859