IP Library Assignment 012387/0903
Patent Assignment
Reel/Frame 012387/0903

Assignment of Assignor's Interest

Recorded: 2001-12-19 Pages: 3
Assignors
RINN, KLAUS, DR.
Executed: 2001-11-21
FRICKE, WOLFGANG
Executed: 2001-11-21
WIENECKER, JOACHIM, DR.
Executed: 2001-11-23
Assignee
LEICA MICROSYSTEMS WETZLAR GMBH
ERNST-LEITZ-STRASSE 17-37, D-35578 WETZLAR, GERMANY
Covered Property (1)
Method and Measuring Instrument for Determining the Position of an Edge of a Pattern Element on a Substrate
Patent: 6,920,249 →
Application: 09/960,734 →
Publication: US 2002/0057839
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 22, 2004
From: LEICA MICROSYSTEMS WETZLAR GMBH
To: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
Reel/Frame 015813/0399 →