Patent Assignment
Reel/Frame 015813/0399
Change of Name
Recorded: 2004-09-22
Pages: 3
Assignor
LEICA MICROSYSTEMS WETZLAR GMBH
Executed: 2004-08-12
Assignee
LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
ERNST-LEITZ-STRASSE 17-37, D-35578 WETZLAR, GERMANY
Covered Properties
(6)
Substrate Holder, and Use of the Substrate Holder in a Highly Accurate Measuring Instrument
Patent:
6,816,253 →
Application:
09/685,772 →
Illumination Device; and Coordinate Measuring Instrument Having an Illumination Device
Method and Measuring Instrument for Determining the Position of an Edge of a Pattern Element on a Substrate
Method and Measuring Arrangement for Detecting an Object
Illumination Device, and Coordinate Measuring Instrument Having an Illumination Device
Substrate Holder, and Use of the Substrate Holder in a Highly Accurate Measuring Instrument
Related Assignments
(6)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Feb 7, 2001
From: BLAESING-BANGERT, CAROLA; KACZYNSKI, ULRICH
To: LEICA MICROSYSTEMS WETZLAR GMBH
Reel/Frame 011509/0873 →
Assignment of Assignor's Interest
Jun 29, 2001
From: CEMIC, FRANZ; DANNER, LAMBERT; HOPPEN, GERHARD
To: LEICA MICROSYSTEMS WETZLAR GMBH
Reel/Frame 011955/0694 →
Assignment of Assignor's Interest
Dec 19, 2001
From: RINN, KLAUS, DR.; FRICKE, WOLFGANG; WIENECKER, JOACHIM, DR.
To: LEICA MICROSYSTEMS WETZLAR GMBH
Reel/Frame 012387/0903 →
Corrective Assignment to Correct the Inventors' Citizenship, Previosuly Recorded at Reel 011955, Frame 0694.
Jan 17, 2002
From: CEMIC, FRANZ; DANNER, LAMBERT; HOPPEN, GERHARD
To: LEICA-MICROSYSTEMS WETZLAR GMBH
Reel/Frame 012479/0537 →
Assignment of Assignor's Interest
Jul 2, 2002
From: RINN, KLAUS
To: LEICA MICROSYSTEMS WETZLAR GMBH
Reel/Frame 013079/0071 →
Assignment of Assignor's Interest
Sep 15, 2005
From: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
To: LEICA MICROSYSTEMS CMS GMBH
Reel/Frame 016536/0330 →