IP Library Granted Patent US 7,209,243
Granted Patent B2
US 7,209,243 · App. 10/776,256 · Granted Apr 24, 2007

Illumination device, and coordinate measuring instrument having an illumination device

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Quick Facts
Patent No.
US 7,209,243
App. No.
10/776,256
Granted
Apr 24, 2007
Kind
B2
Abstract

A coordinate measuring instrument includes a horizontally X-Y displaceable measurement stage for receiving a substrate with a feature that is to be measured, an illumination system, and a detector device. The illumination system includes a light source, an optical fiber bundle, a coupling-in optical system before the optical fiber bundle, a coupling-out optical system after the optical fiber bundle, an illuminating optical system for illuminating an image field, and a homogenizing optical system which is arranged between said coupling-out optical system and said illuminating optical system. The homogenizing optical system homogenizes the non-uniform intensity distribution in the image field of the light emerging from the optical fiber bundle. The light of said light source is picked off via said coupling-in optical system with a large numerical entrance aperture, and is coupled into said optical fiber bundle. The detector device determines the values of X and Y coordinates of the feature within the X-Y displaceable measurement stage.

Claims (38)

1. An illumination device comprising:

a light source;

an optical fiber bundle;

a coupling-in optical system which couples the light of said light source into a first end of said fiber bundle, wherein the coupling-in optical system has a large numerical entrance aperture;

a coupling-out optical system which couples out the light emerging from each fiber of the optical fiber bundle at a second end of said optical fiber bundle, the light emerging from the fibers retaining an inhomogeneous intensity distribution of light corresponding to the inhomogeneous distribution created at the entry of the light into the fibers at the first end of the optical fiber bundle;

an illuminating optical system which illuminates an image field; and

a homogenizing optical system which is arranged between said coupling-out optical system and said illuminating optical system,

wherein said homogenizing optical system homogenizes a nonuniform intensity distribution in the image field of the light emerging from said optical fiber bundle, and wherein homogenization occurs only in an intermediate image plane, and this homogenization is performed only by the homogenizing optical system.

2. An illumination device comprising:

a light source;

an optical fiber bundle;

a coupling-in optical system which couples the light of said light source into a first end of said fiber bundle, wherein the coupling-in optical system has a large numerical entrance aperture NA that is greater than or equal to 0.60;

a coupling-out optical system which couples out the light emerging from each fiber of the optical fiber bundle at a second end of said optical fiber bundle, the light emerging from the fibers retaining an inhomogeneous intensity distribution of light corresponding to the inhomogeneous distribution created upon entry of the light into the fibers at the first end of the optical fiber bundle;

an illuminating optical system which illuminates an image field; and

a homogenizing optical system which is arranged between said coupling-out optical system and said illuminating optical system,

wherein said homogenizing optical system homogenizes the nonuniform intensity distribution in the image field of the light emerging from said optical fiber bundle, and wherein homogenization occurs only in an intermediate image plane, and this homogenization is performed only by the homogenizing optical system.

3. A coordinate measuring instrument comprising:

a horizontally X-Y displaceable measurement stage for receiving a substrate with a feature that is to be measured;

an illumination system including

a light source,

an optical fiber bundle,

a coupling-in optical system before the optical fiber bundle,

a coupling-out optical system after the optical fiber bundle,

an illuminating optical system for illuminating an image field, and

a homogenizing optical system which is arranged between said coupling-out optical system and said illuminating optical system, said homogenizing optical system homogenizes the non-uniform intensity distribution in the image field of the light emerging from the optical fiber bundle, wherein the light of said light source is picked off via said coupling-in optical system with a large numerical entrance aperture, and is coupled into said optical fiber bundle; and

a detector device for determining the coordinates of the feature within the X-Y displaceable measurement stage.

4. The coordinate measuring instrument of claim 3 , wherein the feature is an edge.

5. A coordinate measuring instrument comprising:

a horizontally X-Y displaceable measurement stage for receiving a substrate with a feature that is to be measured;

an illumination system including

a light source,

an optical fiber bundle,

a coupling-in optical system before the optical fiber bundle,

a coupling-out optical system after the optical fiber bundle,

an illuminating optical system for illuminating an image field, and

a homogenizing optical system which is arranged between said coupling-out optical system and said illuminating optical system, said homogenizing optical system homogenizes the nonuniform intensity distribution in the image field of the light emerging from the optical fiber bundle, wherein the light of said light source is picked off via said coupling-in optical system with a large numerical entrance aperture NA that is greater than or equal to 0.60, and is coupled into said optical fiber bundle; and

a detector device for determining the coordinates of the feature within the X-Y displaceable measurement stage.

6. The coordinate measuring instrument of claim 5 , wherein the feature is an edge.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 15, 2005
From: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
To: LEICA MICROSYSTEMS CMS GMBH
Reel/Frame 016536/0330 →
CHANGE OF NAME Recorded Sep 22, 2004
From: LEICA MICROSYSTEMS WETZLAR GMBH
To: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
Reel/Frame 015813/0399 →