Assignment of Assignor's Interest

Recorded: 2002-01-09 Received: 2002-01-17 Pages: 2

Assignor

BAEK, KYE HYUN

Executed: 2001-12-10

Assignee

HYNIX SEMICONDUCTOR INC.

SAN 136-1, AMI-RI, BUBAL-EUB, ICHON-SHI, KYOUNGKI-DO, KRX, KOREA, REPUBLIC OF

Covered Property (1)

Method for Minimizing Variation in Etch Rate of Semiconductor Wafer Caused by Variation in Mask Pattern Density

Application: 10/040,490 →