Assignment of Assignor's Interest

Recorded: 2002-01-14 Received: 2002-01-31 Pages: 2

Assignor

SHIOSAKI, TOYOTAKA

Executed: 2002-01-10

Assignee

NEC CORPORATION

7-1, SHIBA 5-CHOME, MINATO-KU, TOKYO, JPX, JAPAN

Covered Properties (2)

Method for Monitoring the Rate of Etching of a Semiconductor

Application: 10/050,737 →

Data transmission system

Application: 10/047,283 →