IP Library › Assignment 012547/0557
Patent Assignment
Reel/Frame 012547/0557

Assignment of Assignor's Interest

Recorded: 2002-01-31 Pages: 3
Assignors
MARUYAMA, SHIGEYUKI
Executed: 2002-01-24
TASHIRO, KAZUHIRO
Executed: 2002-01-24
WATANABE, NAOYUKI
Executed: 2002-01-24
KOIZUMI, DAISUKE
Executed: 2002-01-24
HASHITANI, TAKAFUMI
Executed: 2002-01-24
YANO, EI
Executed: 2002-01-24
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA 211-8588, JAPAN
Covered Property (1)
Contactor for Testing Semiconductor Device and Manufacturing Method Thereof
Patent: 6,791,345 →
Application: 10/059,114 →
Publication: US 2002/0105347
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 5, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021976/0876 →
Change of Name Aug 2, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024804/0269 →