Assignment of Assignor's Interest

Recorded: 2002-02-25 Received: 2002-03-06 Pages: 2

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Assignors

KATO, YOSHIHARU

Executed: 2002-02-12

KOBAYASHI, ISAMU

Executed: 2002-02-12

Assignee

FUJITSU LIMITED

1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA 211-8588, JPX, JAPAN

Covered Property (1)

Semiconductor Device Having Temperature Detecting Function, Testing Method, and Refresh Control Method of Semiconductor Storage Device Having Temperature Detecting Function

Application: 10/081,232 →