Granted Patent
Utility
US 6,667,925
· Confirmation No. 1658
SEMICONDUCTOR DEVICE HAVING TEMPERATURE DETECTING FUNCTION, TESTING METHOD, AND REFRESH CONTROL METHOD OF SEMICONDUCTOR STORAGE DEVICE HAVING TEMPERATURE DETECTING FUNCTION
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2003-08-26 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2002-02-25 | TRNA |
Transmittal of New Application | 1 | View | |
| 2002-02-25 | SPEC |
Specification | 47 | View | |
| 2002-02-25 | CLM |
Claims | 14 | View | |
| 2002-02-25 | ABST |
Abstract | 1 | View | |
| 2002-02-25 | DRW |
Drawings-only black and white line drawings | 28 | View | |
| 2002-02-25 | OATH |
Oath or Declaration filed | 3 | View |
Inventors
Isamu Kobayashi
Kasugai, JAPAN
Yoshiharu Kato
Kasugai, JAPAN
Attorneys & Agents of Record
Classification
USPC
365/211
G11C7/04
G11C11/406
Prosecution
- Examiner
- LAM, DAVID
- Art Unit
- 2818
- Docket No.
- 024016-00028
- Confirmation No.
- 1658
Foreign Priority
2001-331304
·
2001-10-29
·
JAPAN
Publication
- Pub. No.
- US20030081484A1
- Pub. Date
- 2003-05-01
Patent Term Adjustment
0days
No related applications found.
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2015-04-27
CHANGE OF NAME
Recorded 2010-07-22
from
FUJITSU LIMITED
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2008-12-12
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2002-02-25
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Quick Facts
- Patent No.
- US 6,667,925
- App. No.
- 10/081,232
- Filed
- 2002-02-25
- Granted
- 2003-12-23
- Pub. No.
- US20030081484A1
- Examiner
- LAM, DAVID
- Art Unit
- 2818
- PTA
- 0 days
External Links