Patent Assignment
Reel/Frame 012630/0570
Assignment of Assignor's Interest
Recorded: 2002-03-01
Pages: 4
Assignors
WATANABE, KENJI
Executed: 2002-02-01
SOBUKAWA, HIROSI
Executed: 2002-02-01
NOJI, NOBUHARU
Executed: 2002-02-01
SATAKE, TOHRU
Executed: 2002-02-01
YOSHIKAWA, SHOJI
Executed: 2002-02-01
KARIMATA, TSUTOMU
Executed: 2002-02-01
NAKASUJI, MAMORU
Executed: 2002-02-01
HATAKEYAMA, MASAHIRO
Executed: 2002-02-01
MURAKAMI, TAKESHI
Executed: 2002-02-01
YAMAZAKI, YUICHIRO
Executed: 2002-02-01
NAGAHAMA, ICHIROTA
Executed: 2002-02-01
NAGAI, TAKAMITSU
Executed: 2002-02-01
SUGIHARA, KAZUYOSHI
Executed: 2002-02-01
Assignees
EBARA CORPORATION
11-1, HANEDA ASAHI-CHO, OHTA-KU, TOKYO, JAPAN
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Electron Beam Inspection System and Inspection Method and Method of Manufacturing Devices Using the System
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.