Assignment of Assignor's Interest

Recorded: 2017-06-27 Pages: 2

Assignor

KABUSHIKI KAISHA TOSHIBA

Executed: 2017-06-14

Assignee

EBARA CORPORATION

11-1, HANEDA ASAHI-CHO, OHTA-KU, TOKYO, JAPAN

Covered Property (1)

Electron Beam Inspection System and Inspection Method and Method of Manufacturing Devices Using the System

Patent: 6,992,290 →

Application: 09/985,317 →

Publication: US 2002/0088940

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.