Patent Assignment
Reel/Frame 012715/0340
Assignment of Assignor's Interest
Recorded: 2002-05-21
Received: 2002-05-21
Pages: 2
Assignor
ARAKI, CHIHIRO
Executed: 2002-05-21
Assignee
KABUSHIKI KAISHA MORIC
1450-6 MORI, SHUUCHI-GUN, JPX, JAPAN
Covered Property
(1)
Inspection Method and Inspection Apparatus for Semiconductor Circuit
Application:
10/063,869 →