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App. No. 10/063,869 · Confirmation No. 2434

INSPECTION METHOD AND INSPECTION APPARATUS FOR SEMICONDUCTOR CIRCUIT

Inventor: Chihiro Araki
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗ View Publication ↗
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2003-09-11 REM Applicant Arguments/Remarks Made in an Amendment 1 View
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2003-01-24 SRNT Examiner's search strategy and results 1 View
2002-05-21 TRNA Transmittal of New Application 7 View
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2002-05-21 SPEC Specification 9 View
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2002-05-21 TRNA Transmittal of New Application 5 View
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2002-05-21 SPEC Specification 9 View
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2002-05-21 WFEE Fee Worksheet (SB06) 1 View
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Quick Facts
App. No.
10/063,869
Filed
2002-05-21
Granted
2004-10-26
Pub. No.
US20020180467A1
Art Unit
2829
PTA
-185 days