Patent Assignment
Reel/Frame 012736/0391
Assignment of Assignor's Interest
Recorded: 2002-03-28
Pages: 2
Assignors
MATSUSHITA, HIROSHI
Executed: 2002-03-25
MITSUTAKE, KUNIHIRO
Executed: 2002-03-25
USHIKU, YUKIHIRO
Executed: 2002-03-25
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Equipment for and Method of Detecting Faults in Semiconductor Integrated Circuits