Patent Assignment
Reel/Frame 012752/0694
Assignment of Assignor's Interest
Recorded: 2002-03-28
Received: 2002-04-09
Pages: 3
Assignors
WANG, ZHIGANG
Executed: 2002-03-22
YANG, NIAN
Executed: 2002-03-22
YANG, TIEN-CHUN
Executed: 2002-03-22
Assignee
ADVANCED MICRO DEVICES, INC.
ONE AMD PLACE, SUNNYVALE, CA, 94088, UNITED STATES
Covered Property
(1)
Method of Determining Location of Gate Oxide Breakdown of Mosfet by Measuring Currents
Application:
10/113,017 →