IP Library Granted Patent US 6,756,806
Granted Patent Utility
US 6,756,806 · Confirmation No. 5979

METHOD OF DETERMINING LOCATION OF GATE OXIDE BREAKDOWN OF MOSFET BY MEASURING CURRENTS

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2007-06-05 EBCC.AD Notice of Change of Address Place in File Wrapper Due to Electronic Business Center(EBC) Customer Number Update 1 View
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2003-12-23 WFEE Fee Worksheet (SB06) 1 View
2003-12-23 FWCLM Index of Claims 1 View
2003-11-20 A... Amendment/Request for Reconsideration-After Non-Final Rejection 5 View
2003-11-20 SPEC Specification 1 View
2003-11-20 CLM Claims 8 View
2003-11-20 REM Applicant Arguments/Remarks Made in an Amendment 6 View
2003-08-08 CTNF Non-Final Rejection 4 View
2003-08-08 892 List of references cited by examiner 1 View
2002-06-18 LET. Miscellaneous Incoming Letter 1 View
2002-06-18 DRW Drawings-only black and white line drawings 7 View
2002-03-28 TRNA Transmittal of New Application 4 View
2002-03-28 SPEC Specification 11 View
2002-03-28 CLM Claims 4 View
2002-03-28 ABST Abstract 1 View
2002-03-28 DRW Drawings-only black and white line drawings 5 View
2002-03-28 OATH Oath or Declaration filed 3 View
2002-03-28 IIFW Issue Information including classification, examiner, name, claim, renumbering, etc. 1 View
2002-03-28 SRFW Search information including classification, databases and other search related notes 1 View
2002-03-28 FWCLM Index of Claims 1 View
2002-03-28 TRNA Transmittal of New Application 4 View
2002-03-28 DRW Drawings-only black and white line drawings 5 View
2002-03-28 SPEC Specification 11 View
2002-03-28 CLM Claims 4 View
2002-03-28 ABST Abstract 1 View
2002-03-28 OATH Oath or Declaration filed 3 View
2002-03-28 WFEE Fee Worksheet (SB06) 1 View
2002-03-28 WFEE Fee Worksheet (SB06) 1 View
2002-03-28 WCLM Claims Worksheet (PTO-2022) 1 View
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Quick Facts
Patent No.
US 6,756,806
App. No.
10/113,017
Filed
2002-03-28
Granted
2004-06-29
Art Unit
2829
PTA
-12 days