Patent Assignment
Reel/Frame 012798/0713
Assignment of Assignor's Interest
Recorded: 2002-04-10
Received: 2002-04-22
Pages: 2
Assignee
MITSUBISHI DENKI KABUSHIKI KAISHA
CHIYODA-KU, 2-3, MARUNOUCHI 2-CHOME, TOKYO 100-8310, JPX, JAPAN
Covered Property
(1)
Test circuit for semiconductor memory and semiconductor memory device
Application:
10/118,966 →