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App. No. 10/118,966 · Confirmation No. 9658

Test circuit for semiconductor memory and semiconductor memory device

Abandoned -- Failure to Respond to an Office Action View Publication ↗
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 Code Description Pages PDF
2005-03-23 ABN Abandonment 2 View
2005-03-23 EXIN Examiner Interview Summary Record (PTOL - 413) 2 View
2004-09-21 CTNF Non-Final Rejection 11 View
2004-09-21 1449 List of References cited by applicant and considered by examiner 1 View
2004-09-21 892 List of references cited by examiner 1 View
2004-09-21 BIB Bibliographic Data Sheet 1 View
2004-09-21 FWCLM Index of Claims 1 View
2004-09-21 SRFW Search information including classification, databases and other search related notes 1 View
2004-07-16 SRNT Examiner's search strategy and results 1 View
2002-04-10 TRNA Transmittal of New Application 2 View
2002-04-10 SPEC Specification 24 View
2002-04-10 CLM Claims 3 View
2002-04-10 ABST Abstract 1 View
2002-04-10 DRW Drawings-only black and white line drawings 10 View
2002-04-10 OATH Oath or Declaration filed 3 View
2002-04-10 WFEE Fee Worksheet (SB06) 1 View
2002-04-10 WFEE Fee Worksheet (SB06) 1 View
2002-04-10 WCLM Claims Worksheet (PTO-2022) 1 View
2002-04-10 FRPR Certified Copy of Foreign Priority Application 38 View
2002-04-10 IDS Information Disclosure Statement (IDS) Form (SB08) 3 View
2002-04-10 FOR Foreign Reference 9 View
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Quick Facts
App. No.
10/118,966
Filed
2002-04-10
Pub. No.
US20030065996A1
Art Unit
2133