IP Library › Assignment 012986/0717
Patent Assignment
Reel/Frame 012986/0717

Assignment of Assignor's Interest

Recorded: 2002-06-10 Pages: 2
Assignors
SHISHIDO, CHIE
Executed: 2002-03-15
TAKAGAI, YUJI
Executed: 2002-03-14
WATANABE, MASAHIRO
Executed: 2002-03-14
YOSHITAKE, YASUHIRO
Executed: 2002-03-14
MATSUMOTO, SHUNICHI
Executed: 2002-03-14
IIZUMI, TAKASHI
Executed: 2002-03-29
KOMURO, OSAMU
Executed: 2002-03-14
TANAKA, MAKI
Executed: 2002-03-14
MOROKUMA, HIDETOSHI
Executed: 2002-03-20
Assignee
HITACHI, LTD.
6 KANDA SURUGADAI 4-CHOME, CHIYODA-KU, TOKYO, JAPAN
Covered Property (1)
Method and System for Monitoring a Semiconductor Device Manufacturing Process
Patent: 6,909,930 →
Application: 10/124,412 →
Publication: US 2003/0015660
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Corrected Assignment Resumbitting the Original Cover Sheet Due to Error on the Part of the Applicant Reel/Frame 012986/0717 Jul 29, 2005
From: SHISHIDO, CHIE; TAKAGI, YUJI; WATANABE, MASAHIRO; YOSHITAKE, MASAHIRO
To: HITACHI, LTD.
Reel/Frame 016826/0480 →