Patent Assignment
Reel/Frame 013023/0142
Assignment of Assignor's Interest
Recorded: 2002-06-18
Received: 2002-06-28
Pages: 3
Assignors
WANG, JOHN JIANSHI
Executed: 2002-06-11
WANG, ZHIGANG
Executed: 2002-06-11
YANG, NIAN
Executed: 2002-06-11
Assignee
ADVANCED MICRO DEVICES, INC.
ONE AMD PLACE, P.O. BOX 3453, SUNNYVALE, CA, 94088, UNITED STATES
Covered Properties
(2)
Test Structure to Measure Interlayer Dielectric Effects and Breakdown and Detect Metal Defects in Flash Memories
Application:
10/174,734 →
Polyurethane/Urea Composition for Coating Cylindrical Parts
Application:
10/172,245 →