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App. No. 10/174,734 · Confirmation No. 7135

TEST STRUCTURE TO MEASURE INTERLAYER DIELECTRIC EFFECTS AND BREAKDOWN AND DETECT METAL DEFECTS IN FLASH MEMORIES

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2004-02-03 WFEE Fee Worksheet (SB06) 1 View
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2002-06-18 FWCLM Index of Claims 1 View
2002-06-18 TRNA Transmittal of New Application 4 View
2002-06-18 DRW Drawings-only black and white line drawings 11 View
2002-06-18 SPEC Specification 14 View
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Quick Facts
App. No.
10/174,734
Filed
2002-06-18
Granted
2004-08-17
Art Unit
2818
PTA
-9 days