IP Library Assignment 013156/0645
Patent Assignment
Reel/Frame 013156/0645

Assignment of Assignor's Interest

Recorded: 2002-10-07 Pages: 4
Assignor
MIYAKAWA, TADASHI
Executed: 2002-09-13
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, 105-8001 TOKYO, JAPAN, TOKYO, 105-8001, JAPAN
Covered Property (1)
Sensing Test Circuit
Patent: 6,885,597 →
Application: 10/065,011 →
Publication: US 2004/0047171
Related Assignments (5)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Oct 7, 2002
From: ROEHR, THOMAS; JOACHIM, HANS-OLIVER; REHM, NORBERT
To: INFINEON TECHNOLOGIES AKTIENGESELLSCHAFT
Reel/Frame 013156/0649 →
Assignment of Assignor's Interest Oct 7, 2002
From: ROEHR, THOMAS; JOACHIM, HANS-OLIVER; JACOB, MICHAEL; WOHLFAHRT, JOERG
To: INFINEON TECHNOLOGIES AKTIENGESELLSCHAFT
Reel/Frame 013156/0653 →
Assignment of Assignor's Interest Oct 7, 2002
From: DAISABURO, TAKASHIMA
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 013156/0658 →
Assignment of Assignor's Interest Jan 15, 2010
From: INFINEON TECHNOLOGIES AKTIENGESELLSCHAFT
To: QIMONDA AG
Reel/Frame 023832/0001 →
Assignment of Assignor's Interest May 8, 2015
From: QIMONDA AG
To: INFINEON TECHNOLOGIES AG
Reel/Frame 035623/0001 →