IP Library › Assignment 013223/0005
Patent Assignment
Reel/Frame 013223/0005

Assignment of Assignor's Interest

Recorded: 2002-08-26 Pages: 5
Assignors
SMITH, SHAWN B.
Executed: 2002-08-14
GRIGSBY, BRIAN P.
Executed: 2002-08-13
PHAM, HUNG J.
Executed: 2002-08-13
YEDATORE, MANJUNATH S.
Executed: 2002-08-13
CLEMENTS, WILLIAM R.
Executed: 2002-08-13
DAVIS, TONY L.
Executed: 2002-08-13
Assignee
APPLIED MATERIALS, INC.
3050 BOWERS AVENUE, SANTA CLARA, CALIFORNIA, 95054
Covered Properties (9)
Method and Apparatus for Analyzing Manufacturing Data
Patent: 6,965,895 →
Application: 10/194,920 →
Publication: US 2003/0061212
Automated method for using unsupervised neural networks for discovering and ranking data correlations in an unknow data set
Application: 60/305,256 →
Method for digitizing and analyzing temporal based operating condition data produced in a manufacturing environment
Application: 60/308,121 →
Method for automating data mining in an application service provider (ASP) model
Application: 60/308,122 →
Data translation, SW program, and ranking algorithm use to perform die level defect correlation analysis in unknown data sets
Application: 60/308,123 →
System and method for efficient management, reference, and extraction of large quantities of un-structured relational data
Application: 60/308,124 →
Central control application for flexible branched data mining and statistical analysis for the purpose of automated exploration of statistical comparisons in unknown data sets
Application: 60/308,125 →
Fast statistical scoring and ranking method for correlating numbers to categories or attributes (e.g. Tool Ids).
Application: 60/309,787 →
Fast statistical scoring and ranking method for correlating numerical data by treating data distributions as a series of categories based upon a user configurable parameters which determines how much data is placed in each category
Application: 60/310,632 →