Patent Assignment
Reel/Frame 013327/0555
Assignment of Assignor's Interest
Recorded: 2002-09-23
Pages: 2
Assignors
SAKAI, KAORU
Executed: 2002-09-04
MAEDA, SHUNJI
Executed: 2002-09-04
OKABE, TOKASHI
Executed: 2002-09-04
Assignee
HITACHI, LTD.
6, KANDA SURUGADAI, 4-CHOME CHIYODA-KU, TOKYO, JAPAN
Covered Property
(1)
Defect Detection Method and Its Apparatus