IP Library › Assignment 013410/0548
Patent Assignment
Reel/Frame 013410/0548

Assignment of Assignor's Interest

Recorded: 2002-10-22 Pages: 2
Assignors
MORI, KATSUHIRO
Executed: 2002-10-02
FUJIOKA, SHINYA
Executed: 2002-10-02
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA 211-8588, JAPAN
Covered Property (1)
Semiconductor Integrated Circuit and a Testing Method Thereof
Patent: 6,759,866 →
Application: 10/274,602 →
Publication: US 2003/0098456
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Correction to the Execution Date Mar 25, 2003
From: TAKAHASHI, SATOSHI; YAMASHITA, MINORU
To: FUJITSU LIMITED
Reel/Frame 013885/0715 →
Assignment of Assignor's Interest Dec 12, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021998/0645 →
Change of Name Jul 22, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024982/0245 →
Assignment of Assignor's Interest Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035507/0923 →