IP Library › Assignment 013885/0715
Patent Assignment
Reel/Frame 013885/0715

Correction to the Execution Date

Recorded: 2003-03-25 Pages: 4
Assignors
TAKAHASHI, SATOSHI
Executed: 2003-01-24
YAMASHITA, MINORU
Executed: 2003-01-24
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA 211-8588, JAPAN
Covered Property (1)
Semiconductor Integrated Circuit and a Testing Method Thereof
Patent: 6,759,866 →
Application: 10/274,602 →
Publication: US 2003/0098456
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Oct 22, 2002
From: MORI, KATSUHIRO; FUJIOKA, SHINYA
To: FUJITSU LIMITED
Reel/Frame 013410/0548 →
Assignment of Assignor's Interest Dec 12, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021998/0645 →
Change of Name Jul 22, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024982/0245 →
Assignment of Assignor's Interest Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035507/0923 →