Patent Assignment
Reel/Frame 013432/0106
Assignment of Assignor's Interest
Recorded: 2002-10-29
Pages: 2
Assignee
SHARP KABUSHIKI KAISHA
22-22, NAGAIKE-CHO, ABENO-KU, OSAKA, 545-0013, JAPAN
Covered Property
(1)
Semiconductor Device Having Contact Opening Smaller Than Test Probe, and Manufacturing Process and Inspecting Method Thereof
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.