IP Library Assignment 013499/0039
Patent Assignment
Reel/Frame 013499/0039

Assignment of Assignor's Interest

Recorded: 2003-03-24 Pages: 3
Assignors
TAI, HUNG-EN
Executed: 2003-03-24
YUEH, CHING-LY
Executed: 2003-03-24
Assignee
POWERCHIP SEMICONDUCTOR CORP.
NO. 12, LI-HSIN RD. I,, SCIENCE-BASED INDUSTRIAL PARK, HSIN-CHU CITY, TAIWAN
Covered Property (1)
Method for Analyzing Wafer Test Parameters
Patent: 6,968,280 →
Application: 10/249,213 →
Publication: US 2004/0193381
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jun 28, 2019
From: POWERCHIP SEMICONDUCTOR CORP.
To: POWERCHIP TECHNOLOGY CORPORATION
Reel/Frame 049629/0173 →
Assignment of Assignor's Interest Jul 12, 2019
From: POWERCHIP TECHNOLOGY CORPORATION
To: POWERCHIP SEMICONDUCTOR MANUFACTURING CORPORATION
Reel/Frame 049732/0121 →