IP Library Assignment 013568/0822
Patent Assignment
Reel/Frame 013568/0822

Assignment of Assignor's Interest

Recorded: 2003-04-07 Pages: 5
Assignors
HSUEH, GARY C
Executed: 2003-02-10
MOHAN, SUKESH
Executed: 2003-01-15
Assignee
APPLIED MATERIALS, INC.
P.O. BOX 450-A, PATENT COUNSEL, M/S 2061, SANTA CLARA, CALIFORNIA, 95052
Covered Property (1)
Method and Apparatus Employing Integrated Metrology for Improved Dielectric Etch Efficiency
Patent: 7,265,382 →
Application: 10/293,595 →
Publication: US 2004/0092047
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Oct 15, 2002
From: LYMBERPOLOULOS, DIMITRIS
To: APPLIED MATERIALS, INC.
Reel/Frame 013511/0870 →