Assignment of Assignor's Interest

Recorded: 2002-12-19 Received: 2002-12-23 Pages: 3

Assignor

KAITO, TAKASHI

Executed: 2002-11-26

Assignee

SEIKO INSTRUMENTS INC.

8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, JPX, JAPAN

Covered Property (1)

Method for Forming a Vertical Edge Submicron Through-Hole and a Thin Film Sample with This Kind of Through-Hole

Application: 10/001,332 →