IP Library Assignment 013632/0119
Patent Assignment
Reel/Frame 013632/0119

Assignment of Assignor's Interest

Recorded: 2003-01-06 Pages: 3
Assignor
WATANABE, KAORI
Executed: 2002-12-18
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA 211-8668, JAPAN
Covered Property (1)
Method of Collecting Impurities on Surface of Semiconductor Wafer
Patent: 6,911,096 →
Application: 10/288,768 →
Publication: US 2003/0084926
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Dec 22, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025525/0163 →
Change of Address Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →