Patent Assignment
Reel/Frame 025525/0163
Change of Name
Recorded: 2010-12-22
Received: 2010-12-22
Pages: 9
Assignor
NEC ELECTRONICS CORPORATION
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU,, KAWASAKI-SHI, KANAGAWA, JPX, 211-8668, JAPAN
Covered Properties
(92)
Semiconductor Memory Device and Its Test Method as Well as Test Circuit
Application:
10/362,891 →
Semiconductor Storage and Its Refreshing Method
Application:
10/363,298 →
Semiconductor Memory Device
Application:
10/358,617 →
Semiconductor Integrated Circuit Having Logic Circuit Comprising Transistors with Lower Threshold Voltage Values and Improved Pattern Layout
Application:
10/357,752 →
Timer Circuit and Semiconductor Memory Incorporating the Timer Circuit
Application:
10/343,806 →
Method for Removing Contamination and Method for Fabricating Semiconductor Device
Application:
10/357,087 →
Semiconductor Device
Application:
10/356,517 →
Voltage Controlled Oscillator Having Switches to Adjust Effective Inductor Lengths
Application:
10/352,031 →
Semiconductor Integrated Circuit
Application:
10/352,048 →
Wiring Line for High Frequency
Application:
10/352,301 →
Internal Voltage Level Control Circuit and Semiconductor Memory Device as Well as Method of Controlling the Same
Application:
10/343,042 →
Removing Solution, Cleaning Method for Semiconductor Substrate, and Process for Production of Semiconductor Device
Application:
10/350,185 →
Data Processor Including Clock Thinning-Out Circuit
Application:
10/351,130 →
Semiconductor Memory and Control Method
Application:
10/333,935 →
Phase-Locked Loop Circuit of Fractional Frequency -Dividing Type
Application:
10/349,990 →
Flip Chip Type Semiconductor Device and Method of Manufacturing the Same
Application:
10/347,761 →
Clock Control Circuit and Method
Application:
10/348,707 →
Semiconductor Device, Nonvolatile Semiconductor Storage Apparatus Using the Device, and Manufacture Method of the Device
Application:
10/347,397 →
Semiconductor Memory Device with Memory Cells Having Same Characteristics and Manufacturing Method for the Same
Application:
10/346,071 →
Data Interface Circuit and Data Transmitting Method
Application:
10/345,579 →
Pattern Test Device
Application:
10/345,194 →
Pattern Formation Method
Application:
10/342,796 →
Photomask and Pattern Forming Method Used in a Thermal Flow Process and Semiconductor Integrated Circuit Fabricated Using the Thermal Flow Process
Application:
10/341,160 →
Semiconductor Device Fabricating Method and Treating Liquid
Application:
10/339,658 →
Schottky Gate Field Effect Transistor
Application:
10/337,107 →
Phase-Shifted Distributed Feedback Type Semiconductor Laser Diode Capable of Improving Wavelength Chirping and External Reflection Return Light Characteristics and Method for Manufacturing the Same
Application:
10/336,520 →
Etching Apparatus
Application:
10/334,789 →
Clock Control Circuit and Method
Application:
10/330,275 →
Method for Designing a System Lsi
Application:
10/329,578 →
Semiconductor Memory Device and Write/Readout Controlling Method Error Correction Code Decoding Device
Application:
10/328,435 →
Method of Computer-Assisted Design of Integrated Circuit Chips, and Library of Delay Time Values for Computer-Assisted Design of Such Chips
Application:
10/326,379 →
Photo Mask and Semiconductor Device Manufacturing Method
Application:
10/323,969 →
Semiconductor Integrated Circuit
Application:
10/326,527 →
High-Frequency Circuit
Application:
10/324,404 →
Universal Logic Module and Asic Using the Same
Application:
10/325,572 →
Device for Sticking Protective Sheet on Substrate Surface
Application:
10/322,468 →
Method of Detecting an Integrated Circuit in Failure Among Integrated Circuits, Apparatus of Doing the Same, and Recording Medium Storing Program for Doing the Same
Application:
10/320,500 →
Method of Detecting an Integrated Circuit in Failure Among Integrated Circuits, Apparatus of Doing the Same, and Recording Medium Storing Program for Doing the Same
Application:
10/320,441 →
Method of Detecting an Integrated Circuit in Failure Among Integrated Circuits, Apparatus of Doing the Same, and Recording Medium Storing Program for Doing the Same
Application:
10/320,499 →
Active Bias Circuit Having Wilson and Widlar Configurations
Application:
10/319,995 →
Nonvolatile Storage Device and Operating Method Thereof
Application:
10/319,961 →
Semiconductor Device Having a Roughened Surface
Application:
10/318,199 →
Mask Set for Use in Phase Shift Photolithography Technique Which Is Suitable to Form Random Patterns
Application:
10/315,096 →
Variable Gain Amplifier Circuit
Application:
10/314,603 →
Method for Forming a Semiconductor Device That Uses a Low Resistance Tungsten Silicide Layer with a Strong Adherence to an Underlayer
Application:
10/313,290 →
Chemical Solution Treatment Apparatus for Semiconductor Substrate
Application:
10/309,132 →
Quadrature Mixer Circuit Including Three-Input Local Mixers
Application:
10/307,932 →
Chemical Amplification Type Photoresist Composition, Method for Producing a Semiconductor Device Using the Composition , and Semiconductor Substrate
Application:
10/308,115 →
Alignment Pattern for a Semiconductor Device Manufacturing Process
Application:
10/307,404 →
Bus System and Retry Method
Application:
10/306,685 →
Method for Automatically Laying Out Semiconductor Integrated Circuit
Application:
10/305,054 →
Method of Manufacturing Semiconductor Device
Application:
10/303,275 →
Usb-Hub Device and Its Control Method
Application:
10/301,240 →
Display Control Circuit and Display Device
Application:
10/299,611 →
Nonvolatile Memory Device Having Data Read Operation with Using Reference Cell and Method Thereof
Application:
10/291,216 →
Method of Collecting Impurities on Surface of Semiconductor Wafer
Application:
10/288,768 →
Cmos Buffer Circuit
Application:
10/288,867 →
Cleaning Method, Method for Fabricating Semiconductor Device and Cleaning Solution
Application:
10/284,191 →
Internal Voltage Step-Down Circuit
Application:
10/282,500 →
Semiconductor Device and Manufacturing Method for the Same
Application:
10/281,306 →
Multilayer Semiconductor Wiring Structure with Reduced Alignment Mark Area
Application:
10/281,236 →
Method for Fabricating a Mosfet
Application:
10/278,475 →
Levenson Phase Shift Mask and Method for Forming Fine Pattern by Using the Same
Application:
10/277,512 →
Semiconductor Storage Device
Application:
10/258,334 →
Polishing Method and Polishing Apparatus Permitting Control of Polishing Time at a High Accuracy
Application:
10/273,883 →
Integrated Circuit and Manufacturing Method Therefor
Application:
10/273,161 →
Semiconductor Device and Method for Manufacturing the Same
Application:
10/271,727 →
Integrated Circuit Including an Inductor, Active Layers with Isolation Dielectrics, and Multiple Insulation Layers
Application:
10/273,313 →
Frequency Multiplying System Having a Plurality of Output Frequencies
Application:
10/270,682 →
Magnetic Memory and Method of Its Manufacture
Application:
10/271,007 →
Structure of a capacitive element of a booster circuit included in a semiconductor device and method of manufacturing such a structure
Application:
10/267,246 →
Semiconductor Storage Device
Application:
10/257,193 →
Fractional N Frequency Synthesizer
Application:
10/261,904 →
Digital Phase Control Using First and Second Delay Lines
Application:
10/261,922 →
Esd Protection Element
Application:
10/259,633 →
Semiconductor Device and Method of Manufacturing the Same
Application:
10/260,947 →
Wiring Modeling Technique
Application:
10/252,610 →
Semiconductor Device for Optically Coupling Semiconductor Light-Emitting Device to Optical Fiber
Application:
10/253,752 →
Clock Signal Distribution Circuit
Application:
10/244,507 →
Clock Monitoring Apparatus
Application:
10/242,415 →
Semiconductor Device and a Process for Manufacturing a Complex Oxide Film
Application:
10/242,725 →
Delay Locked Loop
Application:
10/241,515 →
Clock Controlling Method and Circuit
Application:
10/237,713 →
Charge Pump Current Compensating Circuit
Application:
10/237,946 →
Driver Circuit
Application:
10/235,819 →
Liquid-Crystal Display Device and Method of Signal Transmission Thereof
Application:
10/236,280 →
Semiconductor Device and Manufacturing Method of the Same
Application:
10/234,379 →
Mos Differential Amplifier Circuit Having a Wide Linear Input Voltage Range
Application:
10/234,129 →
Random Number Generating Method and Random Number Generating Device
Application:
10/234,337 →
Scan Flip-Flop and Semiconductor Integrated Circuit Device
Application:
10/234,612 →
Semiconductor Devices Having Different Package Sizes Made by Using Common Parts
Application:
10/234,019 →
A Method of Making a Flash Memory Device with an Inverted Tapered Floating Gate
Application:
10/233,798 →