Patent Application
Utility
App. No. 10/357,752
· Confirmation No. 7035
SEMICONDUCTOR INTEGRATED CIRCUIT HAVING LOGIC CIRCUIT COMPRISING TRANSISTORS WITH LOWER THRESHOLD VOLTAGE VALUES AND IMPROVED PATTERN LAYOUT
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-12-16 | C.AD |
Change of Address | 1 | View | |
| 2004-09-09 | CTMS |
Miscellaneous Action with shortened statutory period (SSP) | 2 | View | |
| 2004-09-09 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2004-05-03 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2004-03-26 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 6 | View | |
| 2004-03-26 | FOR |
Foreign Reference | 12 | View | |
| 2004-03-26 | FOR |
Foreign Reference | 19 | View | |
| 2004-03-26 | FOR |
Foreign Reference | 17 | View | |
| 2004-03-26 | FOR |
Foreign Reference | 14 | View | |
| 2004-03-26 | FOR |
Foreign Reference | 10 | View | |
| 2004-03-26 | FOR |
Foreign Reference | 18 | View | |
| 2004-02-03 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2004-02-03 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 2 | View | |
| 2004-02-03 | 1449 |
List of References cited by applicant and considered by examiner | 2 | View | |
| 2004-02-03 | 892 |
List of references cited by examiner | 1 | View | |
| 2004-02-03 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2004-02-03 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-02-03 | FWCLM |
Index of Claims | 1 | View | |
| 2004-02-03 | SRNT |
Examiner's search strategy and results | 1 | View | |
| 2004-01-05 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2004-01-05 | CLM |
Claims | 4 | View | |
| 2004-01-05 | REM |
Applicant Arguments/Remarks Made in an Amendment | 4 | View | |
| 2004-01-05 | DRW |
Drawings-only black and white line drawings | 1 | View | |
| 2004-01-05 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 5 | View | |
| 2004-01-05 | FOR |
Foreign Reference | 8 | View | |
| 2004-01-05 | FOR |
Foreign Reference | 11 | View | |
| 2004-01-05 | FOR |
Foreign Reference | 26 | View | |
| 2004-01-05 | FOR |
Foreign Reference | 12 | View | |
| 2004-01-05 | FOR |
Foreign Reference | 5 | View | |
| 2003-10-14 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 4 | View | |
| 2003-10-14 | FOR |
Foreign Reference | 13 | View | |
| 2003-10-14 | FOR |
Foreign Reference | 7 | View | |
| 2003-10-14 | FOR |
Foreign Reference | 18 | View | |
| 2003-10-14 | FOR |
Foreign Reference | 26 | View | |
| 2003-10-01 | CTNF |
Non-Final Rejection | 7 | View | |
| 2003-10-01 | 892 |
List of references cited by examiner | 1 | View | |
| 2003-10-01 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2003-10-01 | FWCLM |
Index of Claims | 1 | View | |
| 2003-10-01 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2003-10-01 | SRNT |
Examiner's search strategy and results | 2 | View | |
| 2003-08-29 | A.PE |
Preliminary Amendment | 1 | View | |
| 2003-08-29 | REM |
Applicant Arguments/Remarks Made in an Amendment | 4 | View | |
| 2003-02-04 | TRNA |
Transmittal of New Application | 5 | View | |
| 2003-02-04 | A.PE |
Preliminary Amendment | 4 | View | |
| 2003-02-04 | SPEC |
Specification | 28 | View | |
| 2003-02-04 | CLM |
Claims | 6 | View | |
| 2003-02-04 | ABST |
Abstract | 1 | View | |
| 2003-02-04 | DRW |
Drawings-only black and white line drawings | 13 | View | |
| 2003-02-04 | OATH |
Oath or Declaration filed | 2 | View | |
| 2003-02-04 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 4 | View | |
| 2003-02-04 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2003-02-04 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2003-02-04 | WCLM |
Claims Worksheet (PTO-2022) | 1 | View |
Inventors
Susumu Takano
Tokyo, JAPAN
Hiroyuki Takahashi
Tokyo, JAPAN
Minoru Nizaka
Kanagawa, JAPAN
Tomohiro Kitano
Kanagawa, JAPAN
Attorneys & Agents of Record
Classification
USPC
365/51
G11C8/10
H03K19/0948
Prosecution
- Examiner
- AUDUONG, GENE NGHIA
- Art Unit
- 2818
- Customer No.
- 27667
- Docket No.
- NEC OSP-9770 DIV
- Confirmation No.
- 7035
Foreign Priority
11-375831
·
1999-12-28
·
JAPAN
Publication
- Pub. No.
- US20030112673A1
- Pub. Date
- 2003-06-19
Patent Term Adjustment
-124days
from
NEC CORPORATION
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-03-03
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Quick Facts
- App. No.
- 10/357,752
- Filed
- 2003-02-04
- Granted
- 2004-12-21
- Pub. No.
- US20030112673A1
- Examiner
- AUDUONG, GENE NGHIA
- Art Unit
- 2818
- PTA
- -124 days
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