Patent Application
Utility
App. No. 10/648,995
· Confirmation No. 4368
SEMICONDUCTOR INTEGRATED CIRCUIT HAVING LOGIC CIRCUIT COMPRISING TRANSISTORS WITH LOWER THRESHOLD VOLTAGE VALUES AND IMPROVED PATTERN LAYOUT
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-09-21 | CTMS |
Miscellaneous Action with shortened statutory period (SSP) | 2 | View | |
| 2004-09-21 | 1449 |
List of References cited by applicant and considered by examiner | 7 | View | |
| 2004-09-21 | ANE.I |
Amendment After Final or under 37CFR 1.312, initialed by the examiner. | 1 | View | |
| 2004-09-21 | DRW |
Drawings-only black and white line drawings | 1 | View | |
| 2004-09-07 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2004-06-28 | A.NA |
Amendment after Notice of Allowance (Rule 312) | 2 | View | |
| 2004-06-28 | REM |
Applicant Arguments/Remarks Made in an Amendment | 7 | View | |
| 2004-06-28 | DRW |
Drawings-only black and white line drawings | 1 | View | |
| 2004-06-28 | LET. |
Miscellaneous Incoming Letter | 8 | View | |
| 2004-06-10 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2004-06-10 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2004-06-10 | 1449 |
List of References cited by applicant and considered by examiner | 7 | View | |
| 2004-06-10 | 892 |
List of references cited by examiner | 2 | View | |
| 2004-06-10 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2004-06-10 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-05-18 | SRNT |
Examiner's search strategy and results | 1 | View | |
| 2004-03-26 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 5 | View | |
| 2004-03-26 | FOR |
Foreign Reference | 5 | View | |
| 2004-03-26 | FOR |
Foreign Reference | 12 | View | |
| 2004-03-26 | FOR |
Foreign Reference | 19 | View | |
| 2004-03-26 | FOR |
Foreign Reference | 17 | View | |
| 2004-03-26 | FOR |
Foreign Reference | 14 | View | |
| 2004-03-26 | FOR |
Foreign Reference | 10 | View | |
| 2004-02-20 | FWCLM |
Index of Claims | 1 | View | |
| 2004-02-20 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2004-01-08 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 3 | View | |
| 2004-01-08 | FOR |
Foreign Reference | 14 | View | |
| 2003-12-22 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 4 | View | |
| 2003-12-22 | FOR |
Foreign Reference | 5 | View | |
| 2003-12-22 | FOR |
Foreign Reference | 8 | View | |
| 2003-12-22 | FOR |
Foreign Reference | 11 | View | |
| 2003-12-22 | FOR |
Foreign Reference | 26 | View | |
| 2003-12-22 | FOR |
Foreign Reference | 12 | View | |
| 2003-10-14 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 4 | View | |
| 2003-10-14 | FOR |
Foreign Reference | 13 | View | |
| 2003-10-14 | FOR |
Foreign Reference | 7 | View | |
| 2003-10-14 | FOR |
Foreign Reference | 18 | View | |
| 2003-10-14 | FOR |
Foreign Reference | 26 | View | |
| 2003-10-14 | FOR |
Foreign Reference | 6 | View | |
| 2003-08-27 | TRNA |
Transmittal of New Application | 5 | View | |
| 2003-08-27 | SPEC |
Specification | 28 | View | |
| 2003-08-27 | CLM |
Claims | 6 | View | |
| 2003-08-27 | ABST |
Abstract | 1 | View | |
| 2003-08-27 | DRW |
Drawings-only black and white line drawings | 13 | View | |
| 2003-08-27 | OATH |
Oath or Declaration filed | 2 | View | |
| 2003-08-27 | A.PE |
Preliminary Amendment | 1 | View | |
| 2003-08-27 | SPEC |
Specification | 3 | View | |
| 2003-08-27 | CLM |
Claims | 3 | View | |
| 2003-08-27 | REM |
Applicant Arguments/Remarks Made in an Amendment | 1 | View | |
| 2003-08-27 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 4 | View | |
| 2003-08-27 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2003-08-27 | WFEE |
Fee Worksheet (SB06) | 1 | View |
Inventors
Susumu Takano
Tokyo, JAPAN
Hiroyuki Takahashi
Tokyo, JAPAN
Minoru Nizaka
Kanagawa, JAPAN
Tomohiro Kitano
Kanagawa, JAPAN
Attorneys & Agents of Record
Classification
USPC
326/121
G11C8/10
H03K19/0948
Prosecution
Foreign Priority
11-375831
·
1999-12-28
·
JAPAN
Publication
- Pub. No.
- US20040036507A1
- Pub. Date
- 2004-02-26
Patent Term Adjustment
-120days
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